Proposed method for identifying and monitoring workstations with potential exposure to nanomaterials
Author(s): Guseva Canu I, Ducamp S, Delabre L, Audignon Durand S, Ducros C, Durand C, Iwatsubo Y, Jezewski Serra D, Le Bihan O, Malard S, Radauceanu A, Reynier M, Ricaud M, Witschger O
Publishing year: 2015
Pages: 33-62
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