French registry of workers handling engineered nanomaterials as an instrument of integrated system for surveillance and research

Publié le 10 Avril 2013
Mis à jour le 9 septembre 2019

Despite the lack of data on the human health potential risks related to the engineered nanomaterials (ENM) exposure, ENM handling spreads in industry. The French government officially charged the InVS to develop an epidemiological surveillance of workers occupationally exposed to ENM. An initial surveillance plan was proposed on the basis of literature review and discussions with national and international ENM and occupational safety and health (OSH) experts. In site investigations and technical visits were then carried out to build an adequate surveillance system and to assess its feasibility. The current plan consists of a multi-step methodology where exposure registry construction is paramount. Workers potentially exposed to carbon nanotubes (CNT) or nanometric titanium dioxide (TiO2) will be identified using a 3-level approach: 1-identification and selection of companies concerned with ENM exposure (based on compulsory declaration and questionnaires), 2-in site exposure assessment and identification of the jobs/tasks with ENM exposure (based on job-expose matrix, further supplemented with measurements), and 3-identification of workers concerned. Data of interest will be collected by questionnaire. Companies and workers inclusion questionnaires are designed and currently under validation. This registration is at the moment planned for three years but could be extended and include other ENM. A prospective cohort study will be established from this registry, to pursue surveillance objectives and serve as an infrastructure for performing epidemiological and panel studies with specific research objectives. (R.A.)

3rd international conference on safe production and use of nanomaterials (NANOSAFE 2012), Grenoble, 13-15 November 2012

Auteur : Guseva Canu I, Boutou Kempf O, Delabre L, Ducamp S, Iwatsubo Y, Marchand JL, Imbernon E
Journal of Physics. Conference Series, 2013, vol. 429, n°. 1